EMC Compo 2007

6^th International Workshop on Electromagnetic Compatibility of Integrated Circuits

November 28^th - 30^th, 2007

Location: Torino, Italy

The workshop is focused on emission and susceptibility issues of digital, analog and mixed-signal integrated circuits, with a particular emphasis on smart power technologies and System on Chip (SoC) solutions. The most recent advances in measurement techniques, models, standards, tools and design methodologies will be discussed.

Topics

The 6^th International Workshop on Electromagnetic Compatibility of Integrated Circuits is specifically focused on EMC for integrated circuits. Contributions related, but not limited, to the following topics, are welcome:

T1:  Measurement of IC Susceptibility to EMI
T2:  Measurement of IC EM Emission
T3:   IC modelling for EMC
T4:   IC Design for EMC Compliance
T5:   EMC Issues in System on Chip Design
T6:   Substrate Coupling
T7:   Smart Sensor Susceptibility to EMI  
T8:   IC level EMC Education and e-learning
T9:   EMC Issues in Smart Power ICs
T10: Tools to handle EMC at IC level
T11: EMC Issues in Next Generation ICs
T12: Packaging
T13: Signal Integrity
T14: Design of ESD protection for EMI
T15: EMC Issues in ICs for Wireless Communications
T16: EMC Issues in Multi-Chip Modules (MCM)